[1] MEI F S,YUAN T C,LI R D,et al.Effects of particle size and dispersion methods of In2O3-SnO2 mixed powders on the sintering properties of indium tin oxide ceramics[J].International journal of applied ceramic technology,2018,15(1):89-100.[2] 帕提曼·尼扎木丁,玛日耶姆·图尔贡,阿布力孜·伊米提.MOFs薄膜的可控制备及在光波导气体传感器中的应用[J].郑州大学学报(工学版),2019,40(6):53-56.[3] QI C,CHEN J,SUN B S,et al.Microstructure and phase transformation of IGZO targets with different stoichiometry during sintering[J].Ceramics international,2020,46(8):10568-10577.
[4] CHEN J,ZHONG J M,LUO W,et al.Study on powder preparation of IGZO target and its effect on sintering[J].Journal of alloys and compounds,2019,800:468-477.
[5] HONG S J,HAN J I.Synthesis and characterization of indium tin oxide (ITO) nanoparticle using gas evaporation process[J].Journal of electroceramics,2006,17(2/3/4):821-826.
[6] ZHANG W,ZHU G S,ZHI L,et al.Structural,electrical and optical properties of indium tin oxide thin films prepared by RF sputtering using different density ceramic targets[J].Vacuum,2012,86(8):1045-1047.
[7] BELLIDO-GONZwidth=8,height=11,dpi=110LEZ V,DANIEL B,COUNSELL J,et al.Reactive gas control of non-stable plasma conditions[J].Thin solid films,2006,502(1/2):34-39.
[8] CHOU C S,GUO M G,LIU K H,et al.Preparation of TiO2 particles and their applications in the light scattering layer of a dye-sensitized solar cell[J].Applied energy,2012,92:224-233.
[9] WU K R,TING C H,WANG J J,et al.Characteristics of graded TiO2 and TiO2/ITO films prepared by twin DC magnetron sputtering technique[J].Surface and coatings technology,2006,200(20/21):6030-6036.
[10] 姜辛,孙超,洪瑞江.透明导电氧化物薄膜[M].北京:高等教育出版社,2008.
[11] OMATA T,KITA M,OKADA H,et al.Characterization of indium-tin oxide sputtering targets showing various densities of nodule formation[J].Thin solid films,2006,503(1/2):22-28.
[12] 孔伟华.ITO靶材在磁控溅射过程中的毒化现象[J].无机材料学报,2002,17(5):1083-1088.
[13] 姚吉升,唐三川,陈坚,等.ITO靶材在溅射过程中结瘤行为的研究[J].真空科学与技术,2002,22(12):47-50.[14] NAKASHIMA K,KUMAHARA Y.Effect of tin oxide dispersion on nodule formation in ITO sputtering[J].Vacuum,2002,66(3/4):221-226.
[15] LIPPENS P,SEGERS A,HAEMERS J,et al.Chemical instability of the target surface during DC-magnetron sputtering of ITO-coatings[J].Thin solid films,1998,317(1/2):405-408.
[16] ANSELL R O,DICKINSON T,POVEY A F,et al.Quantitative use of the angular variation technique in studies of tin by X-ray photoelectron spectroscopy[J].Journal of electron spectroscopy and related phenomena,1977,11(3):301-313.
[17] ISHIBASHI S,HIGUCHI Y,OTA Y,et al.Low resistivity indium-tin oxide transparent conductive films.II.effect of sputtering voltage on electrical property of films[J].Journal of vacuum science & technology A:vacuum,surfaces,and films,1990,8(3):1403-1406.