[1]Chiefs,Lu Yi,Qiu Qiuyuan.Transformer characteristic tester[J].Journal of Zhengzhou University (Engineering Science),1995,16(01):76-79.
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Journal of Zhengzhou University (Engineering Science)[ISSN
1671-6833/CN
41-1339/T] Volume:
16卷
Number of periods:
1995 01
Page number:
76-79
Column:
Public date:
1995-01-28
- Title:
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Transformer characteristic tester
- Author(s):
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Chiefs; Lu Yi; Qiu Qiuyuan
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Zhengzhou Institute of Technology
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- Keywords:
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Single -chip microcomputer; time -segmentation multiplier; compensation; tester; transformer characteristics
- CLC:
-
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- DOI:
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- Abstract:
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This article introduces the software and hardware structure of the single -chip transformer characteristic tester. The article explains the principles of time -segmentation multiplication in power measurement and automatic correction correction caused by temperature, voltage, current, frequency and intestines. The actual operation results show that the instrument has the advantages of high accuracy, small energy consumption, and stable performance.