[1]Zhu Zhongyi,Failure diagnosis and prediction of electronic systems and equipment[J].Journal of Zhengzhou University (Engineering Science),1992,13(04):46-50.
                                
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                                    Journal of Zhengzhou University (Engineering Science)[ISSN
                                    1671-6833/CN
                                    41-1339/T] Volume:
                                    13
                                    Number of periods:
                                    1992 04
                                    Page number:
                                    46-50
                                    Column:
                                    
                                    Public date:
                                    1992-12-28
                                
                                
                                    - Title:
 
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                                        Failure diagnosis and prediction of electronic systems and equipment
 
                                
                                
                                
                                    - Author(s):
 
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                                        Zhu Zhongyi;
 
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                                        School of PLA Electronic Technology,
 
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                                    - Keywords:
 
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                                        Failure tree;  loss efficiency;  minimum cut set;  minimum road set
 
                                
                                
                                    - CLC:
 
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                                    - DOI:
 
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                                    - Abstract:
 
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                                        This article takes common faults in color TV as an example. The fault tree analysis method is used to explain the construction of the faulty tree and the method of transition from the fault tree to the reliability box diagram. Find the minimum cut and minimum road sets according to the reliability box diagram, and then establish two mathematical models, and finally calculate the failure efficiency and reliability. This analysis method is fully applicable to the reliability test and prediction of general electronic systems, equipment, and reliability assessment for product reliability.