Discussion on the control design scheme of key quantity in paper machine paper

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Discussion on the control design scheme of key quantity in paper machine paper

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[1]Wu Tianfu,Chen Yizhou,Discussion on the control design scheme of key quantity in paper machine paper[J].Journal of Zhengzhou University (Engineering Science),1990,11(01):51-55.

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Journal of Zhengzhou University (Engineering Science)[ISSN 1671-6833/CN 41-1339/T] Volume: 11卷 Number of periods: 1990 01 Page number: 51-55 Column: Public date: 1990-01-28

Title:: Discussion on the control design scheme of key quantity in paper machine paper

Author(s):: Wu Tianfu; Chen Yizhou;; Department of Electrical Engineering, Zhengzhou Institute of Technology, Department of Electrical Engineering, Zhengzhou Institute of Technology,

Keywords:: P standard structure; v norm structure; semi -solve the disaster; Smith estimator

CLC:: -

DOI:: -

Abstract:: In the papermaking industry production, the papermaking process is a multi -variable coupling process, and there is a large stagnation of dead areas. This article adopts the physical thinking that is easy to achieve, and designed the decoupling device and the Smith estimated compensation device together. Then, on this basis, the computer DDC control will be better. Another feature is that even if the computer fails, the system can continue to run stable within a certain range, thereby ensuring reliability.

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Last Update: 1900-01-01