[1]范忠雷,马翔宇,李瑞瑞,等.吸附剂浓度对Cu(II)/ IIP-PAA/SiO2吸附体系的影响[J].郑州大学学报(工学版),2017,38(03):35-38.[doi:10.13705/j.issn.1671-6833.2017.03.003]
　Fan Zhonglei,Ma Xiangyu,Li Ruirui,et al.Effect of sorbent concentration on Cu(II) adsorption at surface ion-imprinted poly(allylamine)-silica material[J].Journal of Zhengzhou University (Engineering Science),2017,38(03):35-38.[doi:10.13705/j.issn.1671-6833.2017.03.003]
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吸附剂浓度对Cu(II)/ IIP-PAA/SiO2吸附体系的影响()
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《郑州大学学报(工学版)》[ISSN:1671-6833/CN:41-1339/T]

卷:
38卷
期数:
2017年03期
页码:
35-38
栏目:
出版日期:
2017-05-28

文章信息/Info

Title:
Effect of sorbent concentration on Cu(II) adsorption at surface ion-imprinted poly(allylamine)-silica material
作者:
范忠雷; 马翔宇; 李瑞瑞; 乔欢欢
郑州大学化工与能源学院,河南郑州,450001
Author(s):
Fan Zhonglei; Ma Xiangyu; Li Ruirui; Qiao Huanhuan
College of Chemical Engineering and Energy, Zhengzhou University, Zhengzhou, Henan 450001 
关键词:
聚烯丙基胺; 硅胶; 浓度效应; Cu(Ⅱ); 吸附
Keywords:
poly(allylamine); silica gel; concentration effect; Cu(Ⅱ); sorbent
DOI:
10.13705/j.issn.1671-6833.2017.03.003
文献标志码:
A
摘要:
采用表面印迹技术合成了铜离子印迹聚烯丙基胺硅胶材料(IIP-PAA/SiO2),通过静态实验研究了吸附剂浓度W0对Cu(Ⅱ)离子在IIP-PAA/SiO2材料上吸附的影响.结果表明,随着W0增加,Cu(Ⅱ)/IIP-PAA/SiO2体系的吸附等温线下降,吸附体系具有明显的吸附剂浓度效应.实验数据显示吸附剂的平衡吸附量Qe与液相平衡浓度Ce和吸附剂浓度W0之间具有相关性,通过Ce/W0(液相平衡离子浓度与吸附剂浓度的比值)因子来修正经典Langmuir模型参数,所得的修正Langmuir等温式能描述和预测不同吸附剂浓度W0水平下的平衡吸附量Qe,表明该修正模型具有合理性.
Abstract:
Surface ion-imprinted poly (allylamine)-silica material (IIP-PAA/SiO2) was synthesized by surface imprinting technique.The effect of sorbent concentration (W0) on Cu(Ⅱ) adsorption was studied using batch experiments.The results showed that the adsorption system exhibited a significant sorbent concentration effect,and adsorption isotherms declined as W0 increased.Results obtained from the tests also indicated that the equilibrium adsorption capacity Qe was not a single function of the equilibrium ion concentration Ce but a function of both Ce and W0.A revised Langmuir model was obtained according to the factor of Ce/W0.Its applicability was examined,and the result showed that the equilibrium capacities under various particle concentrations could be described well by the revised Langmuir model.
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