[1]郑学晶,JOACHIM LOOS..MgCl2负载催化剂和低产率聚合物样品形貌的LVSEM表征[J].郑州大学学报(工学版),2008,29(04):47-50.[doi:10.3969/j.issn.1671-6833.2008.04.011]
Zheng Xuejing,JOACHIM LOOS..LVSEM characterization of MgCl2-supported catalysts and low-yield polymer sample morphology[J].Journal of Zhengzhou University (Engineering Science),2008,29(04):47-50.[doi:10.3969/j.issn.1671-6833.2008.04.011]
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MgCl2负载催化剂和低产率聚合物样品形貌的LVSEM表征(
)
《郑州大学学报(工学版)》[ISSN:1671-6833/CN:41-1339/T]
- 卷:
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29卷
- 期数:
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2008年04期
- 页码:
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47-50
- 栏目:
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- 出版日期:
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1900-01-01
文章信息/Info
- Title:
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LVSEM characterization of MgCl2-supported catalysts and low-yield polymer sample morphology
- 作者:
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郑学晶; JOACHIM LOOS.
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郑州大学材料学院,河南郑州,450001, Department of Chemical Engineering and Chemistry,Eind-hoven University of Technology,5600MB Eindhoven,The Netherlands
- Author(s):
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Zheng Xuejing; JOACHIM LOOS.
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-
- 关键词:
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LVSEM; 催化荆; 形貌; 表征
- Keywords:
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- DOI:
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10.3969/j.issn.1671-6833.2008.04.011
- 文献标志码:
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A
- 摘要:
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采用低压扫描电子显微镜(LVSEM)表征了MgCl2负载的zjegler-Natta催化剂和极低产率聚丙烯颗粒的形貌.MgCl2时空气十分敏感,暴露在空气中十几秒就足以影响催化荆的形貌.LVSEM可以在低的入射电压(如l keV)下就得到高分辨率的图像.在低入射电压下,样品表面不会产生电荷积累.因此无需对样品进行喷涂导电层处理.由于极大地缩短了与空气的接触时间,LVSEM可以避免空气对样品形貌的干扰,成为表征Mgcl2负栽催化剂形貌的有力手段.
- Abstract:
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Low-pressure scanning electron microscopy (LVSEM) was used to characterize the morphology of MgCl2-supported zjegler-Natta catalyst and very low-yield polypropylene particles.MgCl2 air is very sensitive, and exposure to air for more than ten seconds is enough to affect the morphology of Vitex. LVSEM can obtain high-resolution images at low incident voltages such as l keV. At low incidence voltages, no charge buildup occurs on the sample surface. Therefore, there is no need to spray the sample with a conductive layer. Due to the greatly shortened contact time with air, LVSEM can avoid the interference of air on the morphology of the sample, and become a powerful means to characterize the morphology of Mgcl2 negative planting catalyst.
更新日期/Last Update:
1900-01-01